Computations of RHEED intensities for growing surfaces of GaAs
Computations of RHEED intensities for growing surfaces of GaAs Zbigniew Mitura AGH University of Science and Technology,al. A. Mickiewicza 30, 30-059 Kraków, Poland. DOI: https://doi.org/10.7494/cmms.2015.4.0550 Abstract: A novel and practical algorithm for the determination of intensities in reflection high-energy electron diffraction (RHEED) for off-symmetry azimuths is presented. The usefulness of the algorithm is demonstrated for … Read more