Extraction of ion beam from plasma source – Computer Methods in Materials Science

Sensitivity analysis of divergence of ion beam with respect to changes of shape of acceleration grid in kaufman type ion sources

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Sensitivity analysis of divergence of ion beam with respect to changes of shape of acceleration grid in kaufman type ion sources Jacek Rońda, Dominik Osiński Department of Applied Computer Science and Modelling,,University of Science and Technology AGH, Cracow, Poland. DOI: https://doi.org/10.7494/cmms.2009.1.0214 Abstract: This paper presents results of simulation for ion extraction from Kaufman type ion … Read more